Description

Brand: PValley

Model: DE-2128L

Country of Origin: Bangladesh

Features:

• Power Supply,
• Main Unit Dual DC Power Supply,
• Voltage range : +5V/1.5A,-5V/0.3A,+-12V/0.3A,With output overload protection,
• Adjustable DC Power Supply,
• Voltage range : +1.5V ~ +15V,
• current output : 0.5A,With output overload protection,Standard Frequency,
• Frequency : 1MHz,60Hz,1Hz,
• Accuracy : +- 0.01% (1MHz),
• Fan out : 10 TTL load,Clock Signal Generator,
• Frequency : 1Hz ~ 1MHz (6 ranges),1Hz ~ 10Hz,10Hz ~ 100Hz,100Hz ~ 1KHz,1KHz ~ 10KHz,10KHz ~ 100KHz,100KHz ~ 1MHz,

 

Others Specification:

• Fan out : 10 TTL load,
• Data Switch,-8-bit DIP switch x 2,
• 16-bit TTL level output,
• Toggle switch x 4,each with Debounce circuit,
• Fan out : 10 TTL load,
• Pulser Switch,-2 sets of independent control output,
• Each set with Q,Qftoutput,pulse width > 5ms,
• Each set of switch with Debounce circuit,
• Fan out : 10 TTL load,5 Universal counters,Line Signal Generator,
• Frequency : 50Hz/60Hz,
• Output voltage : 6Vrms,With overload protection,
• Thumbwheel Switch : 2-digit,
• BCD code output and common point input,
• Logic Indicator: 16 sets of independent LED indicates,high /low logic state,
• Input Impedance : ¬ 100K ohms,Digital Displays,
• 2 sets of independent 7-segment LED display,With BCD,
• 7-segment decoder/driver and DP input,
• Input with 8-4-2-1,5mm LED displays,
• InchLoInch and InchHiInch LED display low/high logic state respectively,
• Speaker : 8 ohms,0.25W speaker with driver circuit,

 

• Experiment Modules,
• All 13 modules are equipped with an 8-bit DIP,switch for fault simulation.,
• Solutions for all fault test are listed in the,experiment manual for userfts reference.,
• 2mm plugs and sockets are used throughout,the main unit and all modules.,
• Comprehensive experiment manual and instructorfts manual.,
• Module dimension: (255 x 165 x 30) mm.,
• Connection plugs are used on the modules to,prevent accidental damages.,
• Individual keeping case for each module,

 

• List of Experiments,
• Basic Logic Gates Experiments,
  • Introduction to logic gates and switches,
  • Logic gates circuits,
  • Threshold voltage measurement,
  • Voltage/current measurement,
  • Basic logic gate transmission delay measurement,
  • Measurement of basic logic gates characteristics,
  • Interface between logic gates,

 

• Combinational Logic Circuits Experiments,
  • NOR gate circuits,
  • NAND gate circuit,
  • XOR gate circuit,
  • AND-OR-INVERT (AOI) gate circuit,
  • Schmitt gate circuit,
  • Open-collector gate circuits,
  • Tristate gate circuits,
  • Half-adder and full-adder circuits,
  • Half-subtractor and full-subtractor circuit,
  • Arithmetic Logic Unit (ALU) circuit,
  • Bit parity generator circuit,
  • Encoder circuit,
  • Decoder circuit,
  • Multiplexer circuit,
  • Demultiplexer circuit,

 

• Clock Generator Circuit Experiments,
  • Constructing oscillator circuit with basic logic gates,
  • Constructing oscillator circuit with schmitt gate,
  • 555 IC oscillator circuit,
  • Monostablemultivibrator circuits,

 

• Sequential Logic Circuit Experiments,
  • Flip-flop circuits,
  • J-K flip-flop circuits,
    • Asynchronous binary up-counter,
    • Asynchronous decade up-counter,
    • Asynchronous divide-by-N up-counter,
    • Asynchronous binary down-counter,
    • Synchronous binary up-counter,
    • Synchronous binary up/down counter,
  • (6) Constructing dynamic scanning counter with single-chip microprocessor,
  • Converter Circuit Experiment,
    • Digital/Analog Converter (DAC) circuit,
      • Unipolar DAC circuit,
      • Bipolar DAC circuit,
    • Analog/Digital Converter (ADC) circuit,
      • 8-bit converter circuit,
      • 3 1/2 digit converter circuit,

 

• Computer-Based Training,
• Built-in circuit simulation of experiment modules.,
• Fault simulation is allowed.,
• Users can flexibly compare the simulation analysis,Result with hardware signal output.,,

 

• Accessories,
• Experiment Manual and Instructorfts Manual,
• Connection Leads and Plugs,
• Key,
• Warranty: 01 Year,